Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/20.500.12421/4343
Title: A new algorithm for detecting and correcting bad pixels in infrared images
Authors: Restrepo Girón, Andrés David
Loaiza Correa, Humberto
Keywords: Infrared image
Non-destructive testing (NDT)
Pixel correction
Thermography
Issue Date: 22-Jul-2010
Publisher: Ingenieria e Investigacion
Abstract: An image processing algorithm detects and replaces abnormal pixels individually, highlighting them amongst their neighbours in a sequence of thermal images without affecting overall texture, like classical filtering does. Bad pixels from manufacture or constant use of a CCD device in an IR camera are thus detected and replaced with a very good success rate, thereby reducing the risk of bad interpretation. Some thermal sequences from CFRP plates, taken by a Cincinnati Electronics InSb IR camera, were used for developing and testing this algorithm. The results were compared to a detailed list of bad pixels given by the manufacturer (about 70% coincidence). This work becomes relevant considering that the number of papers on this subject is low; most of them talk about astronomical image pre-processing. Moreover, thermographic non-destructive testing (TNDT) techniques are gaining popularity in Colombia at introductory levels in industrial sectors such as energy generation and transmission, sugar production and military aeronautics.
URI: https://repository.usc.edu.co/handle/20.500.12421/4343
ISSN: 0120-5609
Appears in Collections:Artículos Científicos

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