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DC Field | Value | Language |
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dc.contributor.author | Restrepo Girón, Andrés David | - |
dc.contributor.author | Loaiza Correa, Humberto | - |
dc.date.accessioned | 2020-10-01T01:00:20Z | - |
dc.date.available | 2020-10-01T01:00:20Z | - |
dc.date.issued | 2010-07-22 | - |
dc.identifier.issn | 0120-5609 | - |
dc.identifier.uri | https://repository.usc.edu.co/handle/20.500.12421/4343 | - |
dc.description.abstract | An image processing algorithm detects and replaces abnormal pixels individually, highlighting them amongst their neighbours in a sequence of thermal images without affecting overall texture, like classical filtering does. Bad pixels from manufacture or constant use of a CCD device in an IR camera are thus detected and replaced with a very good success rate, thereby reducing the risk of bad interpretation. Some thermal sequences from CFRP plates, taken by a Cincinnati Electronics InSb IR camera, were used for developing and testing this algorithm. The results were compared to a detailed list of bad pixels given by the manufacturer (about 70% coincidence). This work becomes relevant considering that the number of papers on this subject is low; most of them talk about astronomical image pre-processing. Moreover, thermographic non-destructive testing (TNDT) techniques are gaining popularity in Colombia at introductory levels in industrial sectors such as energy generation and transmission, sugar production and military aeronautics. | es |
dc.language.iso | en | es |
dc.publisher | Ingenieria e Investigacion | es |
dc.subject | Infrared image | es |
dc.subject | Non-destructive testing (NDT) | es |
dc.subject | Pixel correction | es |
dc.subject | Thermography | es |
dc.title | A new algorithm for detecting and correcting bad pixels in infrared images | es |
dc.type | Article | es |
Appears in Collections: | Artículos Científicos |
Files in This Item:
File | Description | Size | Format | |
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A new algorithm for detecting and correcting bad pixels.png | 68.09 kB | image/png | View/Open |
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